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Dive into the research topics where Tae-Seong Jang is active.

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Featured researches published by Tae-Seong Jang.


international solid-state circuits conference | 2014

25.1 A 3.2Gb/s/pin 8Gb 1.0V LPDDR4 SDRAM with integrated ECC engine for sub-1V DRAM core operation

Tae-Young Oh; Hoe-ju Chung; Young-Chul Cho; Jang-Woo Ryu; Ki-Won Lee; Changyoung Lee; Jin-Il Lee; Hyoung-Joo Kim; Min Soo Jang; Gong-Heum Han; Kihan Kim; Daesik Moon; Seung-Jun Bae; Joon-Young Park; Kyung-Soo Ha; Jae-Woong Lee; Su-Yeon Doo; Jung-Bum Shin; Chang-Ho Shin; Kiseok Oh; Doo-Hee Hwang; Tae-Seong Jang; Chul-Sung Park; Kwang-Il Park; Jung-Bae Lee; Joo Sun Choi

The recent revolution in handheld computing with high-speed cellular network made mobile processors have multi-cores and powerful 3D graphic engines that support FHD (1920×1080) or even higher resolutions. Consequently, the memory bandwidth requirement has also been increasing, requiring a next-generation mobile DRAM standard. In this paper, we present a power-efficient LPDDR4 SDRAM operating at 3.2Gb/s/pin. Our LPDDR4 DRAM offers 2× bandwidth with improved power efficiency over LPDDR3 SDRAMs, due to the 2-channel architecture and low-voltage-swing terminated logic (LVSTL) [1]. Moreover, the supply voltage is further reduced to 1.0V in this work, 0.1V lower than the LPDDR4 standard, for extra power saving.


IEEE Journal of Solid-state Circuits | 2015

A 3.2 Gbps/pin 8 Gbit 1.0 V LPDDR4 SDRAM With Integrated ECC Engine for Sub-1 V DRAM Core Operation

Tae-Young Oh; Hoe-ju Chung; Jun-Young Park; Ki-Won Lee; Seung-Hoon Oh; Su-Yeon Doo; Hyoung-Joo Kim; ChangYong Lee; Hye-Ran Kim; Jong-Ho Lee; Jin-Il Lee; Kyung-Soo Ha; Young-Ryeol Choi; Young-Chul Cho; Yong-Cheol Bae; Tae-Seong Jang; Chul-Sung Park; Kwang-Il Park; Seong-Jin Jang; Joo Sun Choi

A 1.0 V 8 Gbit LPDDR4 SDRAM with 3.2 Gbps/pin speed and integrated ECC engine for sub-1 V DRAM core is presented. DRAM internal read-modify-write operation for data masked write makes the integrated ECC engine possible in a commodity DRAM. Time interleaved latency and IO control circuits enable 1.0 V operation at target speed. To reach 3.2 Gbps with improved power efficiency over conventional mobile DRAMs, the following IO features are introduced: Low voltage swing terminated logic drivers with VOH level calibration and periodic ZQ calibration, unmatched DQ/DQS scheme and DQS oscillator for DQS tree delay tracking. This chip is fabricated in 25 nm DRAM process on 88.1 mm 2 die area.


Archive | 2001

Semiconductor memory device having fixed CAS latency in normal operation and various CAS latencies in test mode

Tae-Seong Jang; Tae-jin Yoo


symposium on vlsi circuits | 1994

A 256m Dram With Simplified Register Control For Low Power Self Refresh And Rapid Burn-in

Seung-Moon Yoo; Jin Man Han; Ejaz Haq; Sei Seung Yoon; Se-Jin Jeong; Byung-Chul Kim; Jung-Hwa Lee; Tae-Seong Jang; Hyung-Dong Kim; Chan Jong Park; Dong Il Seo; Chang Sik Choi; Soo-In Cho; Chang Gyu Hwang


Archive | 2000

Input circuit having a fuse therein and semiconductor device having the same

Seung-Hoon Lee; Tae-Seong Jang


Archive | 1995

Semiconductor memory device having a shortened test time and contol method therefor

Dong-Il Seo; Tae-Seong Jang


Archive | 1997

Column select line enable circuit for a semiconductor memory device

Dong-Il Seo; Tae-Seong Jang


Archive | 2012

Semiconductor memory device having improved refresh characteristics

Jung-Sik Kim; Cheol Kim; Sang-Ho Shin; Jung-Bae Lee; Chan-Yong Lee; Sung-Min Yim; Tae-Seong Jang; Joo-Sun Choi


Archive | 1998

Operation control circuits and methods for integrated circuit memory devices

Tae-Seong Jang; Sung-Keun Lee


Archive | 1995

Semiconductor memory device capable of driving word lines at high speed

Dong-Il Seo; Tae-Seong Jang

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