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Dive into the research topics where Chul-Sung Park is active.

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Featured researches published by Chul-Sung Park.


international solid-state circuits conference | 2014

25.1 A 3.2Gb/s/pin 8Gb 1.0V LPDDR4 SDRAM with integrated ECC engine for sub-1V DRAM core operation

Tae-Young Oh; Hoe-ju Chung; Young-Chul Cho; Jang-Woo Ryu; Ki-Won Lee; Changyoung Lee; Jin-Il Lee; Hyoung-Joo Kim; Min Soo Jang; Gong-Heum Han; Kihan Kim; Daesik Moon; Seung-Jun Bae; Joon-Young Park; Kyung-Soo Ha; Jae-Woong Lee; Su-Yeon Doo; Jung-Bum Shin; Chang-Ho Shin; Kiseok Oh; Doo-Hee Hwang; Tae-Seong Jang; Chul-Sung Park; Kwang-Il Park; Jung-Bae Lee; Joo Sun Choi

The recent revolution in handheld computing with high-speed cellular network made mobile processors have multi-cores and powerful 3D graphic engines that support FHD (1920×1080) or even higher resolutions. Consequently, the memory bandwidth requirement has also been increasing, requiring a next-generation mobile DRAM standard. In this paper, we present a power-efficient LPDDR4 SDRAM operating at 3.2Gb/s/pin. Our LPDDR4 DRAM offers 2× bandwidth with improved power efficiency over LPDDR3 SDRAMs, due to the 2-channel architecture and low-voltage-swing terminated logic (LVSTL) [1]. Moreover, the supply voltage is further reduced to 1.0V in this work, 0.1V lower than the LPDDR4 standard, for extra power saving.


IEEE Journal of Solid-state Circuits | 2015

A 3.2 Gbps/pin 8 Gbit 1.0 V LPDDR4 SDRAM With Integrated ECC Engine for Sub-1 V DRAM Core Operation

Tae-Young Oh; Hoe-ju Chung; Jun-Young Park; Ki-Won Lee; Seung-Hoon Oh; Su-Yeon Doo; Hyoung-Joo Kim; ChangYong Lee; Hye-Ran Kim; Jong-Ho Lee; Jin-Il Lee; Kyung-Soo Ha; Young-Ryeol Choi; Young-Chul Cho; Yong-Cheol Bae; Tae-Seong Jang; Chul-Sung Park; Kwang-Il Park; Seong-Jin Jang; Joo Sun Choi

A 1.0 V 8 Gbit LPDDR4 SDRAM with 3.2 Gbps/pin speed and integrated ECC engine for sub-1 V DRAM core is presented. DRAM internal read-modify-write operation for data masked write makes the integrated ECC engine possible in a commodity DRAM. Time interleaved latency and IO control circuits enable 1.0 V operation at target speed. To reach 3.2 Gbps with improved power efficiency over conventional mobile DRAMs, the following IO features are introduced: Low voltage swing terminated logic drivers with VOH level calibration and periodic ZQ calibration, unmatched DQ/DQS scheme and DQS oscillator for DQS tree delay tracking. This chip is fabricated in 25 nm DRAM process on 88.1 mm 2 die area.


Archive | 2003

Semiconductor memory device with internal voltage generators for testing a memory array and peripheral circuits

Chul-Sung Park; Hyang-ja Yang; Seung-Min Lee; Yong-Hwan Noh


Archive | 1997

Ferroelectric memory devices having nondestructive read capability and methods of operating same

Byung-Gil Jeon; Chul-Sung Park


Archive | 2003

Semiconductor integrated circuit device with test element group circuit

Chul-Sung Park; Yong-Hwan Noh; Byong-Kwon Lee; Hyang-ja Yang


Archive | 2001

Semiconductor device having a fuse connected to a pad and fabrication method thereof

Kang-Sik Cho; Chul-Sung Park; Gyu-Chul Kim


Archive | 2006

Memory cell power switching circuit in semiconductor memory device and method for applying memory cell power voltage

Chul-Sung Park


Archive | 2003

Semiconductor memory device with improved test mode

Chul-Sung Park; Hyang-ja Yang; Seung-Min Lee; Yong-Hwan Noh


Archive | 2006

Bit line voltage supply circuit in semiconductor memory device and voltage supplying method therefor

Chul-Sung Park; Young-Seung Kim


Archive | 2005

Programmable impedance controller and method for operating

Myung-Han Choi; Nam-Seog Kim; Chul-Sung Park

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