Chul-Sung Park
Samsung
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Publication
Featured researches published by Chul-Sung Park.
international solid-state circuits conference | 2014
Tae-Young Oh; Hoe-ju Chung; Young-Chul Cho; Jang-Woo Ryu; Ki-Won Lee; Changyoung Lee; Jin-Il Lee; Hyoung-Joo Kim; Min Soo Jang; Gong-Heum Han; Kihan Kim; Daesik Moon; Seung-Jun Bae; Joon-Young Park; Kyung-Soo Ha; Jae-Woong Lee; Su-Yeon Doo; Jung-Bum Shin; Chang-Ho Shin; Kiseok Oh; Doo-Hee Hwang; Tae-Seong Jang; Chul-Sung Park; Kwang-Il Park; Jung-Bae Lee; Joo Sun Choi
The recent revolution in handheld computing with high-speed cellular network made mobile processors have multi-cores and powerful 3D graphic engines that support FHD (1920×1080) or even higher resolutions. Consequently, the memory bandwidth requirement has also been increasing, requiring a next-generation mobile DRAM standard. In this paper, we present a power-efficient LPDDR4 SDRAM operating at 3.2Gb/s/pin. Our LPDDR4 DRAM offers 2× bandwidth with improved power efficiency over LPDDR3 SDRAMs, due to the 2-channel architecture and low-voltage-swing terminated logic (LVSTL) [1]. Moreover, the supply voltage is further reduced to 1.0V in this work, 0.1V lower than the LPDDR4 standard, for extra power saving.
IEEE Journal of Solid-state Circuits | 2015
Tae-Young Oh; Hoe-ju Chung; Jun-Young Park; Ki-Won Lee; Seung-Hoon Oh; Su-Yeon Doo; Hyoung-Joo Kim; ChangYong Lee; Hye-Ran Kim; Jong-Ho Lee; Jin-Il Lee; Kyung-Soo Ha; Young-Ryeol Choi; Young-Chul Cho; Yong-Cheol Bae; Tae-Seong Jang; Chul-Sung Park; Kwang-Il Park; Seong-Jin Jang; Joo Sun Choi
A 1.0 V 8 Gbit LPDDR4 SDRAM with 3.2 Gbps/pin speed and integrated ECC engine for sub-1 V DRAM core is presented. DRAM internal read-modify-write operation for data masked write makes the integrated ECC engine possible in a commodity DRAM. Time interleaved latency and IO control circuits enable 1.0 V operation at target speed. To reach 3.2 Gbps with improved power efficiency over conventional mobile DRAMs, the following IO features are introduced: Low voltage swing terminated logic drivers with VOH level calibration and periodic ZQ calibration, unmatched DQ/DQS scheme and DQS oscillator for DQS tree delay tracking. This chip is fabricated in 25 nm DRAM process on 88.1 mm 2 die area.
Archive | 2003
Chul-Sung Park; Hyang-ja Yang; Seung-Min Lee; Yong-Hwan Noh
Archive | 1997
Byung-Gil Jeon; Chul-Sung Park
Archive | 2003
Chul-Sung Park; Yong-Hwan Noh; Byong-Kwon Lee; Hyang-ja Yang
Archive | 2001
Kang-Sik Cho; Chul-Sung Park; Gyu-Chul Kim
Archive | 2006
Chul-Sung Park
Archive | 2003
Chul-Sung Park; Hyang-ja Yang; Seung-Min Lee; Yong-Hwan Noh
Archive | 2006
Chul-Sung Park; Young-Seung Kim
Archive | 2005
Myung-Han Choi; Nam-Seog Kim; Chul-Sung Park