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Dive into the research topics where Takeshi Hamamoto is active.

Publication


Featured researches published by Takeshi Hamamoto.


IEEE Journal of Solid-state Circuits | 2004

A 667-Mb/s operating digital DLL architecture for 512-Mb DDR SDRAM

Takeshi Hamamoto; Kiyohiro Furutani; Takashi Kubo; Satoshi Kawasaki; Hironori Iga; Takashi Kono; Yasuhiro Konishi; Tsutomu Yoshihara

This paper describes an all-digital delay-locked loop (DLL) architecture for over 667 Mb/s operating double-data-rate (DDR) type SDRAMs, which suppresses skews and jitters. Two novel replica adjusting techniques are introduced, in which timing skews caused by the clock input and data output circuits are reduced by a hierarchical phase comparing architecture and a replica check method with slow tester. Further, an improved phase interpolating method suppresses jitters caused by a boundary of the fine and coarse delays. A 512-Mb test device is fabricated using a 0.13-/spl mu/m DRAM process technology, in which skew and jitter suppressed 667-Mb/s (333-MHz) DDR operation has been verified.


IEICE Transactions on Electronics | 2005

Highly Flexible Row and Column Redundancy and Cycle Time Adaptive Read Data Path for Double Data Rate Synchronous Memories

Kiyohiro Furutani; Takeshi Hamamoto; Takeo Miki; Masaya Nakano; Takashi Kono; Shigeru Kikuda; Yasuhiro Konishi; Tsutomu Yoshihara

This paper describes two circuit techniques useful for the design of high density and high speed low cost double data rate memories. One is a highly flexible row and column redundancy circuit which allows the division of flexible row redundancy unit into multiple column redundancy unit for higher flexibility, with a new test mode circuit which enables the use of the finer pitch laser fuse. Another is a compact read data path which allows thp smooth data flow without wait time in the high frequency operation with less area penalty. These circuit techniques achieved the compact chip size with the cell efficiency of 60.6% and the high bandwidth of 400MHz operation with CL=2.5.


Archive | 2003

Semiconductor memory device with reduced current consumption during standby state

Shigehiro Kuge; Takeshi Hamamoto


Archive | 2002

Potential generating circuit capable of correctly controlling output potential

Takeshi Hamamoto; Katsuyoshi Mitsui


Archive | 2002

Clock synchronous type semiconductor memory device

Takeshi Hamamoto; Takeo Miki


Archive | 2001

Semiconductor device and method of inspecting the same

Takeo Miki; Takeshi Hamamoto


Archive | 2001

Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specification

Tetsushi Tanizaki; Takeshi Hamamoto


Archive | 2004

Semiconductor memory device allowing accurate burn-in test

Takashi Kono; Takeshi Hamamoto


Archive | 2002

Semiconductor memory device with enhanced reliability

Kiyohiro Furutani; Takeshi Hamamoto; Takashi Kubo; Shigehiro Kuge


Archive | 2003

Semiconductor memory device having a sub-amplifier configuration

Takashi Kono; Takeshi Hamamoto

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