Ulrich Backhausen
Infineon Technologies
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Publication
Featured researches published by Ulrich Backhausen.
international solid-state circuits conference | 2012
Mihail Jefremow; Thomas Kern; Ulrich Backhausen; Christian Peters; Christoph Parzinger; Christoph Roll; Stephan Kassenetter; Stefanie Thierold; Doris Schmitt-Landsiedel
This paper presents a BL-capacitance-cancelation sensing scheme implemented in a 65nm embedded FLASH technology to overcome the speed limitations of conventional voltage sensing. It is combined with a continuous precharge scheme as described in to increase the robustness of the system supporting the low-swing-sensing phase.
international on-line testing symposium | 2017
Ulrich Backhausen; Oscar Bailan; Paolo Bemardi; Sergio De Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez; A. Sansonetti; Rudolf Ullmann; Federico Venini; Robert Wiesner
Different perspectives about the concept of Robustness in Automotive Electronic are provides by leading edge semiconductor manufacturer. Xilinx contribution is related to the development and evaluation of Software Test Libraries suitable for in-field testing of the interconnect blocks in large SoCs. Infineon (IFX) section is discussing safety and security concerns of On-Line FLASH Memory Repair. STMicroelectronics is providing guidelines for the development and integration of Core Self-Test libraries.
Archive | 2010
Thomas Kern; Ulrich Backhausen; Michael Goessel; Thomas Rabenalt; Stephane Lacouture
Archive | 2010
Mihail Jefremow; Thomas Kern; Ullrich Menczigar; Ulrich Backhausen
Archive | 2014
Thomas Kern; Jens Rosenbusch; Ulrich Backhausen; Thomas Nirschl
Archive | 2013
Ulrich Backhausen; Thomas Kern; Thomas Nirschl; Jens Rosenbusch; Xiangting Bi; Edvin Paparisto
Archive | 2012
Ulrich Backhausen; Thomas Kern; Joerg Syassen
Archive | 2013
Thomas Kern; Jens Rosenbusch; Ulrich Backhausen; Thomas Nirschl
Archive | 2011
Ulrich Backhausen; Thomas Kern; Joerg Syassen
Archive | 2010
Thomas Kern; Ulrich Backhausen; Michael Goessel; Thomas Rabenalt
