Ulrich Backhausen | Researchain

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Featured researches published by Ulrich Backhausen.

international solid-state circuits conference | 2012

Bitline-capacitance-cancelation sensing scheme with 11ns read latency and maximum read throughput of 2.9GB/s in 65nm embedded flash for automotive

Mihail Jefremow; Thomas Kern; Ulrich Backhausen; Christian Peters; Christoph Parzinger; Christoph Roll; Stephan Kassenetter; Stefanie Thierold; Doris Schmitt-Landsiedel

This paper presents a BL-capacitance-cancelation sensing scheme implemented in a 65nm embedded FLASH technology to overcome the speed limitations of conventional voltage sensing. It is combined with a continuous precharge scheme as described in to increase the robustness of the system supporting the low-swing-sensing phase.

international on-line testing symposium | 2017

Robustness in automotive electronics: An industrial overview of major concerns

Ulrich Backhausen; Oscar Bailan; Paolo Bemardi; Sergio De Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez; A. Sansonetti; Rudolf Ullmann; Federico Venini; Robert Wiesner

Different perspectives about the concept of Robustness in Automotive Electronic are provides by leading edge semiconductor manufacturer. Xilinx contribution is related to the development and evaluation of Software Test Libraries suitable for in-field testing of the interconnect blocks in large SoCs. Infineon (IFX) section is discussing safety and security concerns of On-Line FLASH Memory Repair. STMicroelectronics is providing guidelines for the development and integration of Core Self-Test libraries.

Archive | 2010