Yasushi Okuda

Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method

Semiconductor memory device having an energy gap for high speed operation

Probe card and its manufacture

Non-volatile semiconductor memory having an array of non-volatile memory cells and method for driving the same

Semiconductor memory device and fabrication process

MANUFACTURE OF PROBE CARD

Non-volatile semiconductor memory having a ring-shaped floating gate

Method for extending electrically conductive layer into electrically insulating layer

Method of driving semiconductor memory

Method for driving a non-volatile semiconductor memory