Yuichiro Ikeda

Mixed body-bias techniques with fixed V/sub t/ and I/sub ds/ generation circuits

There remains a need to improve sub-1-V CMOS VLSIs with respect to variation in transistor behavior. In this paper, to minimize variation in delay and the noise margin of the circuits in processors, we propose several mixed body bias techniques using body bias generation circuits. In these circuits, either the saturation region of the current between source and drain (I/sub ds/) or the threshold voltage (V/sub t/) of PMOS/NMOS is permanently fixed, regardless of temperature range or variation in process. A test chip that featured these body bias generation circuits was fabricated using a 130-nm CMOS process with a triple-well structure. The mixed body bias techniques which keep the I/sub ds/ of the MOS in the decoder and I/O circuits of a register file fixed and maintain the V/sub t/ of the MOS in both the memory cell and domino circuits of the register file fixed resulted in positive temperature dependence of delay from -40 /spl deg/C to 125 /spl deg/C, 85% reduction of the delay variation compared with normal body bias (NBB) at V/sub DD/ = 0.8 V. In addition, the results using these techniques show a 100-mV improvement in lower operating voltage compared with NBB at -40 /spl deg/C on a 4-kb SRAM.

Mixed body-bias techniques with fixed Vt and Ids generation circuits

In sub 1 V CMOS VLSIs, the authors proposed a new body bias generation circuits in which Ids and Vt of pMOS/nMOS become always fixed. The mixed body bias techniques result in positive temperature dependence of the delay, 85% reduction of the delay variation, and 75% improvement of power consumption of SRAM on a mobile processor.