Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Charles F. Musante is active.

Publication


Featured researches published by Charles F. Musante.


The Japan Society of Applied Physics | 2008

Interconnect and Packaging Technology for CMOS Image Sensors (Invited)

Jeffrey P. Gambino; B. Leidy; Richard J. Rassel; James W. Adkisson; John J. Ellis-Monaghan; Charles F. Musante; Kristin M. Ackerson; B. Guthrie; W. Abadeer; D. Meatyard; Stephen A. Mongeon; Mark D. Jaffe

2. Basis Operation The CMOS imager consists of an array of pixels that detect the incident light. A commonly used pixel is the four transistor or “4T” cell (Fig. 1) [2]. To capture an image, the photodiode is first reversed biased (set to Vdd) using the reset gate and transfer gate (Fig. 2). When the shutter of the camera is opened, light that is incident on the photodiode will generate electron-hole pairs. To sense the charge in the photodiode, the transfer gate is turned on and the charge is moved to the floating diffusion. This changes the potential on the gate of the the source-follower circuit, and the resulting signal is detected at the output of the pixel by turning on the row select transistor. The photo-diode area is much smaller than the total area of the pixel. To overcome this loss of sensitivity, microlenses are used to focus light on the photo-diodes [3]. The quantum efficiency (i.e., the percentage of photogenerated carriers that are detected for each incoming photon) is greatly improved by using microlenses . In order to capture color information from the broad bandwidth incident light, color filters are used so that each pixel captures mainly one color of light (i.e., red, green, or blue). The color filters consist of dyed photoresist that is arranged in alternating rows or either green and blue or green and red [4]..


Archive | 2010

Anti-reflection structures for CMOS image sensors

James W. Adkisson; John J. Ellis-Monaghan; Jeffrey P. Gambino; Charles F. Musante


Archive | 2009

Methods for forming anti-reflection structures for cmos image sensors

James W. Adkisson; John J. Ellis-Monaghan; Jeffrey P. Gambino; Charles F. Musante


Archive | 2008

Pixel sensor cell with frame storage capability

James W. Adkisson; John J. Ellis-Monaghan; Rajendran Krishnasamy; Solomon Mulugeta; Charles F. Musante; Richard J. Rassel


Archive | 2009

High efficiency cmos image sensor pixel employing dynamic voltage supply

James W. Adkisson; John J. Ellis-Monaghan; Mark D. Jaffe; Charles F. Musante; Richard J. Rassel


Archive | 2011

DELAMINATION AND CRACK RESISTANT IMAGE SENSOR STRUCTURES AND METHODS

Jeffrey P. Gambino; Mark D. Jaffe; Robert K. Leidy; Charles F. Musante; Richard J. Rassel


Archive | 2005

ONE-MASK HIGH-K METAL-INSULATOR-METAL CAPACITOR INTEGRATION IN COPPER BACK-END-OF-LINE PROCESSING

Ebenezer E. Eshun; Jessie Fortune Abbotts; Daniel W. Colello; Douglas D. Coolbaugh; Zhong-Xiang He; Matthew D. Moon; Charles F. Musante; Robert M. Rassel


Archive | 2010

CMOS PIXEL SENSOR CELLS WITH POLY SPACER TRANSFER GATES AND METHODS OF MANUFACTURE

James W. Adkisson; John J. Ellis-Monaghan; Rajendran Krishnasamy; Solomon Mulugeta; Charles F. Musante; Richard J. Rassel


Archive | 2010

METHODS, STRUCTURES, AND DESIGN STRUCTURES FOR IMPROVED ADHESION OF PROTECTIVE LAYERS OF IMAGER MICROLENS STRUCTURES

Edward C. Cooney; Jeffrey P. Gambino; Robert K. Leidy; Charles F. Musante; John G. Twombly


Archive | 2014

Flattened substrate surface for substrate bonding

Edward C. Cooney; James S. Dunn; Dale W. Martin; Charles F. Musante; BethAnn Rainey; Leathen Shi; Edmund J. Sprogis; Cornelia K. Tsang

Researchain Logo
Decentralizing Knowledge