Jean-Paul Dom

Numerical modelling of mechanisms involved in latchup triggering by a laser beam

The use of a laser beam is a well-known technique to trigger latchup parasitic structures in ICs. Numerical analyses of this phenomenon are brought into play to study its sensitivity when a continuous wave laser as well as pulsed lasers are used. The impact location is also studied to demonstrate that different mechanisms are involved in the triggering phase of latchup. The structure is also more sensitive to the blue light when it is directed over the well-substrate junction while it is more sensitive to infrared light elsewhere. When using a CW laser, the curves giving the power supply current versus the photo-induced current provide direct information on the parameters of the parasitic structure.

Analysis of latchup susceptibility to internal logical states by using a laser beam

Abstract Experimental results using a laser beam in order to demonstrate the dependence of the latchup sensitivity versus internal logical states are presented. The latch-up triggering mechanisms involved by this method are then numerically analysed by the means of a 2D device simulator in a mixed mode environment. We show that the susceptibility to the latchup phenomenon is increased when the MOS transistor concerned by the parasitic structure is in its low impedance state. It also demonstrates that the usual precautions taken in order to prevent the latchup phenomenon may be efficiently put to the test by using a laser beam contactless testing technique.

Fast Prototyping for BiCMOS Analog Integrated Circuits Design

At University Bordeaux 1, analog integrated circuit electronics teaching adresses students from ‘IUP Genie Electrique et Informatique Industrielle’ second and third year, from Licence and Maitrise Electronique, Electrotechnique et Automatique (EEA) and from DESS Microelectronique (from Bachelors to Masters of Science). Our pedagogic objective is to be able to provide students a concrete example of circuit integration [1], starting from theoretical electronics knowledge to the test of their own designed circuit. In this paper, we detail the actual project proposed in the Microelectronics DESS training courses, focusing on the laser beam writing system developed in our laboratory and on a personal BiCMOS prediffused array designed in AMS BiCMOS 0. 8 µm technology