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Michael Roehner

Infineon Technologies

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Publication

Featured researches published by Michael Roehner.

Archive | 2001

Semiconductor memory used especially as a ferroelectric random access memory has capacitor devices each vertically extending from a substrate and/or a passivating region and/or a surface region

Matthias Kroenke; Rainer Bruchhaus; Gerhard Enders; Walter Hartner; Thomas Mikolajick; Nicolas Nagel; Michael Roehner

Archive | 2001

Production of a semiconductor memory used as an FeRAM memory comprises forming a semiconductor substrate, a passivating region and/or a surface region, forming capacitor arrangements, and providing contact regions or plug regions

Matthias Kroenke; Rainer Bruchhaus; Gerhard Enders; Walter Hartner; Thomas Mikolajick; Nicolas Nagel; Michael Roehner

Archive | 2001

Manufacturing method of semiconductor memory device esp. chain-FeRAM store, involves forming passivation zone and surface zone from this extending mainly vertically in structure

Rainer Bruchhaus; Gerhard Enders; Walter Hartner; Matthias Kroenke; Thomas Mikolajick; Nicolas Nagel; Michael Roehner

Archive | 2016

Testing of Semiconductor Devices and Devices, and Designs Thereof

Michael Roehner; Stefano Aresu

Archive | 2013

Testing of Semiconductor Components and Circuit Layouts Therefor

Michael Roehner; Stefano Aresu; Markus Zannoth

Archive | 2015

Schaltung und Verfahren zur internen Bestimmung der dielektrischen Zuverlässigkeit einer Halbleitertechnologie

Michael Roehner; Stefano Aresu; Marco Faricelli

Archive | 2015

Schaltung und Verfahren zur internen Bestimmung der dielektrischen Zuverlässigkeit einer Halbleitertechnologie Circuit and method for determining the internal dielectric reliability of semiconductor technology

Michael Roehner; Stefano Aresu; Marco Faricelli

Archive | 2015

Circuit and method for determining the internal dielectric reliability of a semiconductor technology

Michael Roehner; Stefano Aresu; Marco Faricelli

Archive | 2014

Kondensatoren in integrierten Schaltungen und Verfahren zu deren Herstellung Capacitors in integrated circuits and methods for their preparation

Stefano Aresu; Michael Roehner

Archive | 2014

Testing of semiconductor devices, and devices and their interpretation

Stefano Aresu; Michael Roehner

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Stefano Aresu

Infineon Technologies

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Nicolas Nagel

Infineon Technologies

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Gerhard Enders

Infineon Technologies

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Matthias Kroenke

Infineon Technologies

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Rainer Bruchhaus

Infineon Technologies

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Thomas Mikolajick

Dresden University of Technology

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Walter Hartner

Infineon Technologies

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Marco Faricelli

Infineon Technologies

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Igor Kasko

Infineon Technologies

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Markus Zannoth

Infineon Technologies

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