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Featured researches published by Mikio Asakura.


symposium on vlsi circuits | 1990

A circuit design of intelligent CDRAM with automatic write back capability

Kazutami Arimoto; Mikio Asakura; Hideto Hidaka; Yoshio Matsuda; Kazuyasu Fujishima

The authors describe a unique intelligent memory based on a distributed CDRAM (cache DRAM) architecture, which consists of three hierarchical memory sections, DRAM, SRAM, and CAM, that constitute on-chip TAG. This architecture provides a high-performance intelligent main memory and a pin compatibility with high-speed address nonmultiplexed memories (DRAM, SRAM, and pseudo-SRAM). This RAM can be fabricated by the standard CMOS DRAM process with little area penalty. The intelligent CDRAM with an automatic write-back function can realize a short average read/write cycle time. The write-back operation without a complex controller minimizes the write cycle time drastically compared with write through


european solid state circuits conference | 1991

A 34ns 16MbDRAM with controllable voltage down convertor

Kazutami Arimoto; Hideto Hidaka; Masanori Hayashikoshi; Mikio Asakura; Kazuyasu Fujishima; Tsutomu Yoshihara

The centrally active cholinesterase inhibitor physostigmine induces a behavioral syndrome which is thought to represent a model of spontaneous depression. In the present acute trial in 6 healthy volunteers, this model depression was accompanied by clearcut cardiovascular, metabolic and neuroendocrine phenomena of stress. The extent of the changes from baseline, however, scarcely correlated between the behavioral and physiologic phenomena. The behavioral and physiological phenomena could not be antagonized by brofaromine, a putative antidepressant reversibly and selectively inhibiting monoamine oxidase A (MAO-A), contrasting to the complete inhibition by the central cholinolytic scopolamine. This is further evidence that antidepressant efficacy depends on long-term adaptive changes secondary to the enhancement of aminergic neurotransmission rather than this enhancement itself.


international symposium on vlsi technology systems and applications | 1993

A smart design methodology for advanced memories

Kazutami Arimoto; Mikio Asakura; Masaki Tsukude; Hideto Hidaka; Kazuyasu Fujishima

The authors propose a smart design methodology for advanced memories to reduce the turn around time for circuit revisions with no area penalty. This method was applied to the development of 16 Mb DRAM with double metal wiring. The turn around time can be reduced to 1/8 by 1500 gates of extra n-ch and p-ch transistors under the power line and the signal line. This design methodology is confirmed to be very effective.<<ETX>>


symposium on vlsi circuits | 1991

Cell-Plate Line Connecting Complementary Bitline (c/sup 3/) Architecture For Battery Operating DRAMs

Mikio Asakura; K. Arimoto; Hideto Hidaka; Kazuyasu Fujishima


Archive | 2000

RING OSCILLATOR HAVING VARIABLE CAPACITANCE CIRCUITS FOR FREQUENCY ADJUSTMENT

Tsukasa Ooishi; Tomoya Kawagoe; Hideto Hidaka; Mikio Asakura


Archive | 2000

Semiconductor memory device allowing switching of word configuration

Shigekazu Aoki; Seiji Sawada; Mikio Asakura; Takeshi Hamamoto; Masakazu Hirose


Archive | 1997

Semiconductor device with efficiently arranged pads

Kenichi Yasuda; Hideto Hidaka; Mikio Asakura; Tsukasa Ooishi; Kei Hamade


Archive | 1995

Level conversion circuit, internal potential generating circuit, internal potential generating unit, semiconductor device and manufacture of transistor

Mikio Asakura; Hideto Hidaka; Yuichiro Komiya; Tsukasa Oishi; 司 大石; 祐一郎 小宮; 秀人 日高; 幹雄 朝倉


Archive | 1992

Halbleitervorrichtung und Verfahren zum Überwachen eines Potentials auf einer internen Versorgungsspannungsleitung derselben

Kazutami Arimoto; Hideto Hidaka; Mikio Asakura; Masanori Hayashikoshi; Masaki Tsukude; Shinji Kawai; Tsukasa Ooishi


Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E | 1987

Mechanism of bit line mode soft error for DRAM

Mikio Asakura; Yoshio Matsuda; Katsuhiro Tsukamoto; Kazuyasu Fujishima; Tsutomu Yoshihara

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