Moon-Gone Kim
Samsung
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Publication
Featured researches published by Moon-Gone Kim.
IEEE Journal of Solid-state Circuits | 2005
Myoung-Kyu Seo; Soung-Hoon Sim; Myoung-Hee Oh; Hyo-sang Lee; Sang-Won Kim; In-Wook Cho; Gyu-Hong Kim; Moon-Gone Kim
In a 0.13-/spl mu/m CMOS logic compatible process, a 256K /spl times/ 32 bit (8 Mb) local SONOS embedded flash EEPROM was implemented using the ATD-assisted current sense amplifier (AACSA) for 0.9 V (0.7 /spl sim/ 1.4 V) low V/sub CC/ application. Read operation is performed at a high frequency of 66 MHz and shows a low current of typically 5 mA at 66-MHz operating frequency. Program operation is performed for common source array with wide I/Os (/spl times/32) by using the data-dependent source bias control scheme (DDSBCS). This novel local SONOS embedded flash EEPROM core has the cell size of 0.276 /spl mu/m/sup 2/ (16.3 F/sup 2//bit) and the program and erase time of 20 /spl mu/s and 20 ms, respectively.
symposium on vlsi circuits | 2004
M.K. Seo; Soung-Hoon Sim; Y.H. Sim; M.H. On; Sang-Woo Kim; In-Wook Cho; H.S. Lee; G.H. Kim; Moon-Gone Kim
In 0.13 /spl mu/m CMOS logic compatible process, we implemented 256K/spl times/32bit(8Mb) SONOS embedded flash EEPROM using ATD-assisted Current Sense Amplifier (AACSA) for 0.9V(0.7V/spl sim/1.4V) low V/sub CC/ application. Read operation is performed at a high frequency of 66MHz and shows a low current of typically 5mA at 66MHz operating frequency. Program operation is performed for common source array with wide I/Os(X32) by using Data-dependent Source Bias Control Scheme (DDSBCS). This novel SONOS embedded Flash EEPROM core has the cell size of 0.276um/sup 2/ and the program and erase time of 20us and 20ms respectively.
symposium on vlsi circuits | 2004
K.J. Noh; Yun-Ho Choi; J.D. Joo; Min-Su Kim; J.H. Jung; J.J. Lim; Chung-Heon Lee; G.H. Kim; Moon-Gone Kim
A SRAM-like embedded DRAM compiler with 0.13um technology was designed using two novel circuit schemes. Firstly, Dual Asymmetric bit line Sensing Scheme is proposed to implement VDD bit line pre-charge scheme without any reference cells and half charge generator. Therefore, we overcame the risk of failure caused by defects in reference cells and simplified embodying VDD bit line pre-charge scheme, enjoying privileges of VDD bit line pre-charge scheme such as fast sensing speed (tRC:7ns, tAC:6.7ns in this work) and stable sensing operation at low voltage and low temperature. Secondly, we propose circuit idea for quiet unselected IO lines. Unselected IO lines are not developed by bit line data during READ/WRITE operation. This scheme has advantage in the architecture with wide IO and various IO multiplexing options like a memory compiler.
Archive | 1992
Moon-Gone Kim; Sei-Seung Yoon
Archive | 1993
Seung-Cheol Oh; Moon-Gone Kim
Archive | 1992
Sei-Seung Yoon; Moon-Gone Kim
Archive | 1996
Hoon Choi; Moon-Gone Kim
symposium on vlsi circuits | 2005
Myoung-Kyu Seo; Soung-Hoon Sim; Myoung-Hee Oh; Hyo-sang Lee; Sang-Won Kim; In-Wook Cho; Gyu-Hong Kim; Moon-Gone Kim
Archive | 1992
Moon-Gone Kim; Sei-Seung Yoon
Archive | 1998
Jae-gu Roh; Moon-Gone Kim