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Dive into the research topics where Takashi Okada is active.

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Featured researches published by Takashi Okada.


Microelectronics International | 1997

Effectiveness of Thin‐film Barrier Metals for Eutectic Solder Bumps

Soichi Honma; K. Tateyama; H. Yamada; Kazuhide Doi; Naohiko Hirano; Takashi Okada; H. Aoki; Yoichi Hiruta; T. Sudo

This paper describes effective thin‐film structure barrier metals for use as eutectic solder bumps. Shear strength and bump interconnection resistance were evaluated. The mutual diffusion in metals was investigated. Barrier metal structures —Cu/Ti,Ni/Ti and Cu/Cr—were evaluated after ageing. The Ni/Ti structure has good reliability according to ageing test results. Pd is used for improvement of solder wettability and as an oxidisation barrier. Consequently, it was concluded that a thin‐film Pd/Ni/ Ti barrier metal is suitable for use as eutectic solder bumps. The broken interfaces of the solder bumps were analysed by scanning auger electron spectrometry. In the thin‐film Cu/Ti structure, decrease in the shear strength is caused by three mechanisms, as determined from the broken interface analysis. The three mechanisms are mixed metal formation, Ti oxidisation and diffusion between barrier metals and Al. Furthermore, TCT and PCT were carried out on these eutectic solder bumps to confirm the interconnection...


ieee multi chip module conference | 1994

Characterization of net configurations for multichip modules

Takashi Okada; Toshio Sudo

An investigation of the design considerations for MCMs based on CMOS VLSI has been carried out with the aim of achieving a higher performance system. Included in the investigation were output driver and receiver characteristics and net configurations in MCM. Four MCM types have been introduced: MCM-D, MCM-Si, MCM-C, and MCM-L. Time domain analysis using the SPICE simulation program was carried out taking into consideration a lossy transmission line model. A simpler criterion for the critical damping condition and an estimation method for the signal delay of the network with a lumped circuit approximation is proposed to determine a preferable interconnect network including the output driver and the loads. The effect of the net configuration was also analyzed and the preferences among the net configurations have been represented with only two net parameters, the total net length and the far-end length.<<ETX>>


SID Symposium Digest of Technical Papers | 2011

43.4: An In‐Cell Capacitive Touch‐Sensor Integrated in an LTPS WSVGA TFT‐LCD

Satoru Tomita; Takashi Nakamura; Tetsuo Morita; Takayuki Imai; Takashi Okada; Hirotaka Hayashi; Yasuo Saruhashi; Masayoshi Fuchi; Miyuki Hashimoto; Masahiro Tada; Takahiko Endo; Keiichi Saito; Hiroki Nakamura; Hideyuki Takahashi

We have developed an in-cell capacitive touch-sensor integrated in an LTPS 7″ WSVGA TFT-LCD. The prototype having 256×150 sensors shows advantages such as smooth operation with no touch force, high position accuracy, multi-touch (10 or more), thin and light LCD module, and thus is suitable for various applications.


Archive | 1995

Flip-chip semiconductor devices having two encapsulants

Kazuhide Doi; Masayuki Miura; Takashi Okada; Naohiko Hirano; Yoichi Hiruta


Archive | 1995

Connecting electrode portion in semiconductor device

Naohiko Hirano; Kazuhide Doi; Masayuki Miura; Takashi Okada; Yoichi Hiruta


Archive | 1996

Flip chip mounting type semiconductor device

Naohiko Hirano; Kazuhide Doi; Chiaki Takubo; Hiroshi Tazawa; Eiichi Hosomi; Yoichi Hiruta; Takashi Okada; Koji Shibasaki


Archive | 1997

Flip-chip connection type semiconductor integrated circuit device

Takashi Okada; Naohiko Hirano; Hiroshi Tazawa; Eiichi Hosomi; Chiaki Takubo; Kazuhide Doi; Yoichi Hiruta; Koji Shibasaki


ISHM'95 | 1995

Prediction of Thermal Fatigue Life for Encapsulated Flip-chip Interconnection,”

Kazuhide Doi; Naohiko Hirano; Takashi Okada; Y.Hiruta Y.Hiruta; T.Sudo T.Sudo; Minoru Mukai; Toshio Sudo


Archive | 2010

Semiconductor device and memory card using the same

Takashi Okada; Kiyokazu Okada; Akinori Ono; Taku Nishiyama


Archive | 2006

Semiconductor memory device and usb memory device using the same

Yasuo Takemoto; Naohisa Okumura; Taku Nishiyama; Takashi Okada

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