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Dive into the research topics where Vitalij Ocheretnij is active.

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Featured researches published by Vitalij Ocheretnij.


asian test symposium | 2001

A new code-disjoint sum-bit duplicated carry look-ahead adder for parity codes

Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel

A new code-disjoint self-checking carry look-ahead adder is proposed. To reduce the necessary area and the power dissipation only the sum bits of the adder cells are duplicated. This is possible since the input parity is determined by use of internal nodes of the adder cells. The adder is modeled by a SYNOPSIS CAD tool from the EUROCHIP-Project with a standard library. With respect to duplication and comparison the necessary area and the power dissipation can be reduced up to 38 % and up to 29 % respectively compared to an increase of the maximal delay of only 12 %.


international on line testing symposium | 2004

Self-checking code-disjoint carry-select adder with low area overhead by use of add1-circuits

Vitalij Ocheretnij; Daniel Marienfeld; Egor S. Sogomonyan; Michael Gössel

In this paper, a new code-disjoint totally self-checking carry-select adder, with low area overhead, is proposed which is based on the simplified design of carry-select adders by use of add1-circuits as proposed in (T. Y. Chang et al., IEE Elec. Lett., vol.34, no.22, p.2101-2103, 1998) and (Y. Kim et al., ISCAS, p.218-221, 2001). The area overhead for the proposed adder is only 40% of a traditional carry-select adder without error detection.


asian test symposium | 2005

New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors

Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel

In this paper, a new self-checking code-disjoint Booth-2 multiplier with an improved error detection and with a reduced area overhead is proposed. Compared to the 64 times 64 multiplier without error detection the area for the proposed multiplier increases for the different implementations only by 23%-30%. Especially for soft errors the error detection capability is significantly improved. All even or odd (soft) errors in the output registers are detected


european test symposium | 2004

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder

Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel

In this paper a new self-checking multiplier which consists of an AND-matrix, a carry-save adder and a final sumbit duplicated adder is proposed. The AND-matrix and the carry-save adder are parity checked. All errors due to single stuck-at faults in the combinational part and all even or odd (soft) errors in one of the duplicated output registers are detected. The parity checked carry-save adder is implemented by use of carry-dependent sum adder cells with a single carry-out signal. Compared to a corresponding multiplier without error detection the necessary area is about 125% to 135%.


international on-line testing symposium | 2003

A modulo p checked self-checking carry select adder

Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld

In this paper a new self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20%. No restrictions are imposed on the design of the adder blocks.


defect and fault tolerance in vlsi and nanotechnology systems | 2002

Partially duplicated code-disjoint carry-skip adder

Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan

In this paper a new self-checking code-disjoint partially duplicated fast carry-skip adder is proposed which is for 64 bits the fastest self-checking adder known so far. For the first time the adder cells of a fast carry-ripple adder are used for the design of a carry-skip adder. The propagate signals are implemented only once. They are utilized to compute the duplicated sum bits and simultaneously to check the input parity and some internal XOR-gates.


design, automation, and test in europe | 2004

A new self-checking sum-bit duplicated carry-select adder

Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel

In this paper the first code-disjoint totally self-checking carry-select adder is proposed. The adder blocks are fast ripple adders with a single NAND-gate delay for carry-propagation per cell. In every adder block both the sum-bits and the corresponding inverted sum-bits are simultaneously implemented. The parity of the input operands is checked against the XOR-sum of the propagate signals. For 64 bits area and maximal delay are determined by the SYNOPSYS CAD tool of the EUROCHIP project. Compared to a 64 bit carry-select adder without error detection the delay of the most significant sum-bit does not increase. The area is 170% of a 64 bit carry-select adder (without error detection and not code-disjoint).


international on-line testing symposium | 2001

Code-disjoint carry-dependent sum adder with partial look-ahead

Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan

In this paper a self-checking code-disjoint carry-dependent sum adder is proposed. To reduce the hardware overhead, only every 4-th carry is generated by a look-ahead unit. To check the input parity, internal nodes of the adder cells are utilized.


international on-line testing symposium | 2002

A new self-checking code-disjoint carry-skip adder

Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel

In this paper the first self-checking code-disjoint carry-skip adder is investigated The adder is code-disjoint with respect to the parity encoded operands and self-testing and fault-secure with respect to all single stuck-at faults of the adder cells.


Journal of Electronic Testing | 2004

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

Michael Goessel; Krishnendu Chakrabarty; Vitalij Ocheretnij; Andreas Leininger

We present a new technique for uniquely identifying a single failing vector in an interval of test vectors. This technique is applicable to combinational circuits and for scan-BIST in sequential circuits with multiple scan chains. The proposed method relies on the linearity properties of the MISR and on the use of two test sequences, which are both applied to the circuit under test. The second test sequence is derived from the first in a straightforward manner and the same test pattern source is used for both test sequences. If an interval contains only a single failing vector, the algebraic analysis is guaranteed to identify it. We also show analytically that if an interval contains two failing vectors, the probability that this case is interpreted as one failing vector is very low. We present experimental results for the ISCAS benchmark circuits to demonstrate the use of the proposed method for identifying failing test vectors.

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V. V. Saposhnikov

Petersburg State Transport University

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Vl. V. Saposhnikov

Petersburg State Transport University

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