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Dive into the research topics where Wayne F. Ellis is active.

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Featured researches published by Wayne F. Ellis.


Ibm Journal of Research and Development | 1995

Multipurpose DRAM architecture for optimal power, performance, and product flexibility

Wayne F. Ellis; John E. Barth; Jeffrey H. Dreibelbis; A. Furman; Erik L. Hedberg; H. S. Lee; Thomas M. Maffitt; C. P. Miller; C. H. Stapper; Howard Leo Kalter; S. Divakaruni

An 18Mb DRAM has been designed in a 3.34, 0.5-pm CMOS process. The array consists of four independent, self-contained 4.5Mb quadrants. The chip output configuration defaults to 1 Mb x 18 for optimization of wafer screen tests, while 3 .34 or 5.04 operation is selected by choosing one of two M2 configurations. Selection of 2Mb x 9 or 1 Mb x 18 operation with the various address options, in extended data-out or fast-page mode, is accomplished by selective wire-bonding during module build. Laser fuses enable yield enhancement by substituting eight 512Kb array I/O slices for nine in each quadrant of the 18Mb array. This substitution is independent in each quadrant and results in 1 Mb x 16 operation with 2Mb x 8, 4Mb x 4, and 4Mb x 4 with any 4Mb independently selectable (4Mb x 4 w/4 CE). Input and control circuitry are designed such that performance margins are constant across output and functional configurations. The architecture also provides for “cut-downs” to 16Mb, 4.5Mb, and 4Mb chips with I/O and function as above.


Archive | 1991

Low voltage programmable storage element

Wagdi W. Abadeer; Badih El-Kareh; Wayne F. Ellis; Duane Elmer Galbi; Nathan Rafael Hiltebeitel; William R. Tonti; Josef S. Watts


Archive | 2003

Gate length proximity corrected device

Shahid Butt; Wayne F. Ellis; John A. Gabric


Archive | 2001

Rolling ball connector

Joseph A. Benenati; Claude L. Bertin; William T. Chen; Thomas Edward Dinan; Wayne F. Ellis; Wayne J. Howell; John U. Knickerbocker; Mark V. Pierson; William R. Tonti; Jerzy M. Zalesinski


Archive | 2001

Structures for wafer level test and burn-in

John E. Barth; Claude L. Bertin; Jeffrey H. Dreibelbis; Wayne F. Ellis; Wayne J. Howell; Erik L. Hedberg; Howard Leo Kalter; William R. Tonti; Donald L. Wheater


Archive | 1997

Multi-port multiple-simultaneous-access DRAM chip

Jeffrey H. Dreibelbis; Wayne F. Ellis; Thomas J. Heller; Michael Ignatowski; Howard Leo Kalter; David Meltzer


Archive | 2002

System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)

Wagdi W. Abadeer; Wayne F. Ellis; Patrick R. Hansen; Jonathan M. McKenna


Archive | 1995

Memory device with programmable self-refreshing and testing methods therefore

David Elson Douse; Wayne F. Ellis; Erik L. Hedberg


Archive | 2003

Method for performing a command cancel function in a dram

Wayne F. Ellis; Mark W. Kellogg; Daniel J. Phipps


Archive | 2001

Integrated fuse latch and shift register for efficient programming and fuse readout

John A. Fifield; Wayne F. Ellis; Nicholas M. Van Heel

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