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Dive into the research topics where Daniel John Nickel is active.

Publication


Featured researches published by Daniel John Nickel.


Archive | 1998

Method for verifying design rule checking software

William F. DeCamp; Laurice Thorsen Earl; Jason Steven Minahan; James Montstream; Daniel John Nickel; Joseph J. Oler; Richard Q. Williams


Archive | 1991

Dynamic RAM with on-chip ECC and optimized bit and word redundancy

John E. Barth; Charles Edward Drake; John A. Fifield; William Paul Hovis; Howard Leo Kalter; Scott C. Lewis; Daniel John Nickel; Charles H. Stapper; James Andrew Yankosky


Archive | 1995

Method and system using the design pattern of IC chips in the processing thereof

Cheryl A. Hoffman; Mark A. Lavin; William C. Leipold; Kathleen McGroddy; Daniel John Nickel


Archive | 1998

Method of automated ESD protection level verification

Roy S. Bass; Daniel John Nickel; Daniel Sullivan; Steven H. Voldman


Archive | 2004

IC DESIGN DENSITY CHECKING METHOD, SYSTEM AND PROGRAM PRODUCT

William F. DeCamp; Daniel John Nickel


Archive | 1991

Low power addressing systems

John E. Barth; Charles Edward Drake; William Paul Hovis; Howard Leo Kalter; Gordon Arthur Kelley; Scott C. Lewis; Daniel John Nickel; James Andrew Yankosky


Archive | 2004

Winkelige Phasenform für eine verminderte Beeinträchtigung des Layouts

Scott J. Bukofsky; John K. DeBrosse; Marco Hug; Lars W. Liebmann; Daniel John Nickel; Jürgen Preuninger


Archive | 2004

Winkelige Phasenform für eine verminderte Beeinträchtigung des Layouts Angular phase form of decreased degradation of the layout

Scott J. Bukofsky; John K. DeBrosse; Marco Hug; Lars W. Liebmann; Daniel John Nickel; Jürgen Preuninger


Archive | 2004

Angular phase form of reduced impairment of the layout

Scott J. Bukofsky; John K. DeBrosse; Marco Hug; Lars W. Liebmann; Daniel John Nickel; Jürgen Preuninger


Archive | 2003

Layout impact reduction with angled phase shapes

Scott J. Bukofsky; John K. DeBrosse; Marco Hug; Lars W. Liebmann; Daniel John Nickel; Juergen Preuninger

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