David J. Alcoe
IBM
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Publication
Featured researches published by David J. Alcoe.
international electronics manufacturing technology symposium | 2003
David J. Alcoe; Kim J. Blackwell; Rajinder Rai
This paper describes mechanical reliability and relative cost comparisons from the system ownership point of view. Total system cost performance of a PTFE based organic ball grid array chip package is compared, on a relative basis, to that obtained with other BGA packages having organic as well as ceramic technologies. Mechanical reliability performance values obtained in common reliability testing are projected to field usage performance, and compared across these various package types. The paper discusses the results for large body sizes and large die sizes, where interesting trends are noted. Considering the various package types and sizes, this study identifies primary assembly (to printed wiring board) costs, on a relative basis, including standard BGA assembly, land grid array with sockets, and column grid array. Combining this assembly data with package reliability projections, a simple guide is provided for the total cost of ownership over a period of time. Further refinement, including system availability and service costs, is discussed.
Archive | 2010
David J. Alcoe; Francis J. Downes; Gerald Walter Jones; John S. Kresge; Cheryl L. Tytran-Palomaki
Archive | 1998
David J. Alcoe; Steven Wayne Anderson; Yifan Nmn Guo; Eric A. Johnson
Archive | 1999
David J. Alcoe
Archive | 2001
David J. Alcoe; Jeffrey T. Coffin; Michael A. Gaynes; Harvey C. Hamel; Mario J. Interrante; Brenda L. Peterson; Megan J. Shannon; William E. Sablinski; Christopher Todd Spring; Randall J. Stutzman; Renee L. Weisman; Jeffrey A. Zitz
Archive | 2003
David J. Alcoe; William L. Brodsky; Varaprasad V. Calmidi; Sanjeev B. Sathe; Randall J. Stutzman
Archive | 1997
David J. Alcoe; Sanjeev B. Sathe
Archive | 1996
David J. Alcoe; Steven Wayne Anderson; Yifan Guo; Eric A. Johnson
Archive | 2007
David J. Alcoe; Varaprasad V. Calmidi
Archive | 2002
David J. Alcoe; Varaprasad V. Calmidi; Krishna Darbha; Sanjeev B. Sathe