Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Hideaki Uchida is active.

Publication


Featured researches published by Hideaki Uchida.


custom integrated circuits conference | 1990

A 6-ns 256-kbit BiCMOS TTL SRAM

Takashi Akioka; Atsushi Hiraishi; Tatsumi Yamauchi; Yuji Yokoyama; Shigeru Takahashi; Masahiro Iwamura; Yutaka Kobayashi; Akira Ide; Nobuyuki Gotou; Kazunori Onozawa; Hideaki Uchida

A 6-ns 64K*4-b BiCMOS, transistor-transistor logic (TTL)-I/O SRAM has been developed. Fast access time is due to the combination of innovative circuits and a double-metal, double-polysilicon 0.8- mu m Hi-BiCMOS process technology. The novel circuits include a reduced-stage BiCMOS decoder and a current-sense-type address transition detection circuit. The chip size is 4.25 mm*10 mm. Simulated internal delay time components of a critical path of the decoder are shown. Address access time is 6 ns at T/sub a/=25 degrees C, V/sub CC/=5 V with a 30 pF load connected to the common I/O node.<<ETX>>


symposium on vlsi circuits | 1994

Circuit Techniques For An 8-ns Ecl 100K Compatible 3.3v 16mb Bicmos Sram With Minimum Operation Voltage Of 2.3v

Takashi Akioka; Seigoh Yukutake; Kenichi Fukui; Kinya Mitsumoto; Atsushi Hiraishi; Kaoru Nakagawa; Noboru Akiyama; Masahiro Iwamura; Yutaka Kobayashi; Shuji Ikeda; Hideaki Uchida

We describe new circuit techniques for an 8-11s ECL compatible 16Mb BiCMOS SRAM. This is the first reported implementation of ECL lOOK U0 compatibility with an operation voltage of less than 3.0V. We developed an ECL reference circuit that operates with a 2.3V supply voltage. A novel hierarchically divided common-emitter sense circuit reduces the delay due to long data lines to achieve a simulated address access time of 8ns under typical operating conditions.


Archive | 1994

Semiconductor CMOS memory device with separately biased wells

Shinji Nakazato; Hideaki Uchida; Yoshikazu Saito; Masahiro Yamamura; Yutaka Kobayashi; Takahide Ikeda; Ryoichi Hori; Goro Kitsukawa; Kiyoo Itoh; Nobuo Tanba; Takao Watanabe; Katsuhiro Shimohigashi; Noriyuki Homma


Archive | 1987

Memory device with improved common data line bias arrangement

Kinya Mitsumoto; Shinji Nakazato; Yoshiaki Yazawa; Masanori Odaka; Hideaki Uchida; Nobuaki Miyakawa


Archive | 1994

Semiconductor memory device having separately biased wells for isolation

Shinji Nakazato; Hideaki Uchida; Yoshikasu Saito; Masahiro Yamamura; Yutaka Kobayashi; Takahide Ikeda; Ryoichi Hori; Goro Kitsukawa; Kiyoo Itoh; Nobuo Tanba; Takao Watanabe; Katsuhiro Shimohigashi; Noriyuki Homma


Archive | 1991

Semiconductor memory device having bipolar transistor and structure to avoid soft error

Shinji Nakazato; Hideaki Uchida; Yoshikazu Saito; Masahiro Yamamura; Yutaka Kobayashi; Takahide Ikeda; Ryoichi Hori; Goro Kitsukawa; Kiyoo Itoh; Nobuo Tanba; Takao Watanabe; Katsuhiro Shimohigashi; Noriyuki Homma


Archive | 1990

High speed, low noise output buffer with non-identical pairs of output transistors

Atsushi Hiraishi; Takashi Akioka; Yutaka Kobayashi; Yuji Yokoyama; Masahiro Iwamura; Tatsumi Yamauchi; Shigeru Takahashi; Hideaki Uchida; Akira Ide


Archive | 1987

Semiconductor integrated circuit device with a protective circuit

Masahiro Iwamura; Ikuro Masuda; Hideaki Uchida


Archive | 1994

Signal transition detector circuit

Takashi Akioka; Masahiro Iwamura; Atsushi Hiraishi; Yuji Yokoyama; Nozomu Matsuzaki; Tatsumi Yamauchi; Yutaka Kobayashi; Nobuyuki Gotou; Akira Ide; Masahiro Yamamura; Hideaki Uchida


Archive | 1992

High speed, low noise semiconductor storage device

Masahiro Iwamura; Tatsumi Yamauchi; Makoto Saeki; Hideaki Uchida

Collaboration


Dive into the Hideaki Uchida's collaboration.

Researchain Logo
Decentralizing Knowledge