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Dive into the research topics where Lyndon R. Logan is active.

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Featured researches published by Lyndon R. Logan.


Ibm Journal of Research and Development | 2005

Embedded DRAM: technology platform for the Blue Gene/L chip

Subramanian S. Iyer; John E. Barth; Paul C. Parries; James P. Norum; James P. Rice; Lyndon R. Logan; Dennis Hoyniak

The Blue Gene®/L chip is a technological tour de force that embodies the system-on-a-chip concept in its entirety. This paper outlines the salient features of this 130-nm complementary metal oxide semiconductor (CMOS) technology, including the IBM unique embedded dynamic random access memory (DRAM) technology. Crucial to the execution of Blue Gene/L is the simultaneous instantiation of multiple PowerPC® cores, high-performance static random access memory (SRAM), DRAM, and several other logic design blocks on a single-platform technology. The IBM embedded DRAM platform allows this seamless integration without compromising performance, reliability, or yield. We discuss the process architecture, the key parameters of the logic components used in the processor cores and other logic design blocks, the SRAM features used in the L2 cache, and the embedded DRAM that forms the L3 cache. We also discuss the evolution of embedded DRAM technology into a higher-performance space in the 90-nm and 65-nm nodes and the potential for dynamic memory to improve overall memory subsystem performance.


Archive | 1995

Method to suppress subthreshold leakage due to sharp isolation corners in submicron FET structures

Louis L. Hsu; Chang-Ming Hsieh; Lyndon R. Logan


Archive | 2004

Method of controlling floating body effects in an asymmetrical SOI device

James W. Adkisson; Michael J. Hargrove; Lyndon R. Logan; Isabel Y. Yang


Archive | 2003

Method and structure to reduce CMOS inter-well leakage

Lyndon R. Logan; James A. Slinkman


Archive | 2009

DIAGNOSTIC METHOD FOR ROOT-CAUSE ANALYSIS OF FET PERFORMANCE VARIATION

Lyndon R. Logan


Archive | 2015

Fin-type PIN diode array

Lyndon R. Logan; Edward J. Nowak; Robert R. Robison


Archive | 2016

HIGH VOLTAGE FINFET STRUCTURE WITH SHAPED DRIFT REGION

Lyndon R. Logan; Edward J. Nowak; Robert R. Robison


Archive | 2015

CAPACITIVE MEASUREMENTS OF DIVOTS IN SEMICONDUCTOR DEVICES

Lyndon R. Logan; Edward J. Nowak; Robert R. Robison; Yan He


Archive | 2014

MEASURING CURRENT AND RESISTANCE USING COMBINED DIODES/RESISTOR STRUCTURE TO MONITOR INTEGRATED CIRCUIT MANUFACTURING PROCESS VARIATIONS

Lyndon R. Logan; Edward J. Nowak; Robert R. Robison; K. Winslow Ii Jonathan


Archive | 2013

ZRAM HETEROCHANNEL MEMORY

Andres Bryant; Lyndon R. Logan; Edward J. Nowak; Robert R. Robison

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