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Dive into the research topics where Wen-Han Wang is active.

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Featured researches published by Wen-Han Wang.


international symposium on vlsi technology, systems, and applications | 2007

Low Programming Current Phase Change Memory Cell with Double GST Thermally Confined Structure

Der-Sheng Chao; Hong-Hui Hsu; Ming-Jung Chen; Yi-Chan Chen; Fred Chen; Chain-Ming Lee; Philip H. Yen; Chih-Wei Chen; Wen-Han Wang; Wei-Su Chen; Chenhsin Lien; Ming-Jer Kao; Ming-Jinn Tsai

A novel PCM cell with double GST thermally confined structure was proposed and fabricated in this work. by inserting an extra bottom GST layer under the confined GST region, the heat loss can be effectively prevented and the temperature profile over active region becomes more uniform. thus, a low reset current less than 0.3 ma can be achieved and the set performance is also improved to be faster than 200 ns.


international symposium on vlsi technology, systems, and applications | 2007

Performances of GeSnSbTe Material for High-Speed Phase Change Memory

Chain-Ming Lee; Der-Sheng Chao; Yi-Chan Chen; Ming-Jung Chen; Philip H. Yen; Chih-Wei Chen; Hong-Hui Hsu; Wen-Han Wang; Wei-Su Chen; Fred Chen; Tsai-Chu Hsiao; Ming-Jer Kao; Ming-Jinn Tsai

In this paper, a new application of phase change material GeSnSbTe (GSST) is proposed for high-speed phase-change memory (PCM). The device characteristics of PCM employing GeSnSbTe and conventional Ge2Sb2Te5 (GST) are compared. Because of high crystallization speed, the GSST device demonstrates the benefits of shorter SET pulse, lower SET current, and higher resistance ratio.


non-volatile memory technology symposium | 2006

Snapback by Hot Filament

Jyi-Tyan Yeh; Fred Chen; Der-Sheng Chao; Wen-Han Wang; Yi-Chan Chen; Chain-Ming Lee; Ming-Jinn Tsai; Ming-Jer Kao

A simulation procedure using the conventional thermal-electric finite element method for the phase change memory has been developed. By introducing a defect on the amorphous chalcogenide of a reset phase change memory, the snapback by hot filament due to thermal runaway has been investigated by the numerical simulations with three-dimensional model.


international symposium on vlsi technology, systems, and applications | 2006

Novel T shape structure PCM and Electrical-Thermal Characteristics

Wen-Han Wang; Der-Sheng Chao; Y. C. Chen; Chain-Ming Lee; Hong-Hui Hsu; Y. Chuo; M. H. Tseng; M. H. Lee; Wei-Su Chen; Ming-Jer Kao; Ming-Jinn Tsai

Novel interfacial layer structure was proposed with adjustable resistance ratio and more uniform data distribution capabilities. The reduction of writing power can also be expected with further optimizing the materials and corresponding thicknesses. The performance will be even better with the shrinking of contact area


international symposium on vlsi design, automation and test | 2007

4-Mb SPI Flash Compatible Phase-Change Memory

Shyh-Shyuan Sheu; Wen-Han Wang; Pei-Chia Chiang; Keng-Li Su; Ming-Jer Kao; Ming-Jinn Tsai

A 4-Mb with SPI serial interface phase-change memory which is completely compatible with the traditional SPI flash memory is implemented in this study. The peripheral circuit is much simpler than flash memory. The 512 Kb sector erase time is less than 7 ms while the 4 Mb bulk erase time is 80 ms only.


Archive | 2007

DRIVING METHOD AND SYSTEM FOR A PHASE CHANGE MEMORY

Shyh-Shyuan Sheu; Pei-Chia Chiang; Wen-Han Wang


Archive | 2006

Lateral phase change memory with spacer electrodes and method of manufacturing the same

Te-Sheng Chao; Wen-Han Wang; Min-Hung Lee; Hong-Hui Hsu; Chien-Min Lee; Yen Chuo; Yi-Chan Chen; Wei-Su Chen


Archive | 2006

Phase-change memory layer and method of manufacturing the same and phase-change memory cell

Yi-Chan Chen; Hong-Hui Hsu; Chien-Min Lee; Yen Chuo; Te-Sheng Chao; Wen-Han Wang; Wei-Su Chen; Min-Hung Lee


Archive | 2007

METHOD AND SYSTEM FOR DRIVING PHASE CHANGE MEMORY

Pei-Chia Chiang; Shyh-Shyuan Sheu; Wen-Han Wang; 烈萩 林; 培嘉 江; 文翰 王; 世玄 許


non-volatile memory technology symposium | 2007

S-shaped negative differential resistance modeling in electro-thermal simulation of phase-change memory programming

Fred Chen; Der-Sheng Chao; M.-J. Chen; P. Yen; Jyi-Tyan Yeh; Chain-Ming Lee; Wen-Han Wang; Ming-Jer Kao; Ming-Jinn Tsai

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Ming-Jer Kao

Industrial Technology Research Institute

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Ming-Jinn Tsai

Industrial Technology Research Institute

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Chain-Ming Lee

Industrial Technology Research Institute

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Der-Sheng Chao

National Tsing Hua University

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Hong-Hui Hsu

Industrial Technology Research Institute

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Yi-Chan Chen

Industrial Technology Research Institute

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Wei-Su Chen

Industrial Technology Research Institute

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Fred Chen

Industrial Technology Research Institute

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Ming-Jung Chen

Industrial Technology Research Institute

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Pei-Chia Chiang

Industrial Technology Research Institute

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