David Eric Tremouilles

Transient voltage overshoot in TLP testing — Real or artifact?

This paper investigates on the transient pulse response of the device under test, which is becoming a critical aspect in determining the ESD reliability of a variety of technology products. For the first time, the feasibility to calibrate or tune the artifacts arising out of system parasitic to `see the device transient response is presented in this paper with experimental data and numerical analysis.

T-diodes - a novel plug-and-play wideband RF circuit ESD protection methodology

A novel plug-and-play ESD protection methodology for wideband RF applications is demonstrated. This methodology utilizes an integrated transformer together with classical ESD protection elements. As a demonstrator, a wideband RF LNA in 0.18 mum CMOS is protected above 4.5 kV HBM without degrading its bandwidth.

Advanced ESD power clamp design for SOI FinFET CMOS technology

Two novel ESD power clamp design techniques for SOI FinFET CMOS technology are reported. First, a layout improvement technique is discussed for stacked gated diodes, which reduces the required area for a given ESD robustness and at the same time reduces the on-resistance of the clamp. Secondly, circuit design techniques are used to convert a standard RC-triggered active ESD clamp into a bi-directional design, thereby alleviating the need for a separate reverse protection diode. The concepts can be applied for planar SOI as well.

Characterization and modeling of diodes in Sub-45 nm CMOS technologies under HBM stress conditions

Diodes in a sub-45 nm CMOS technology, bulk and FinFET, are both investigated for their behavior under real-time ESD conditions. A new compact ESD diode model is developed and validated for HBM ESD transients. Forward recovery behavior during both TLP and HBM ESD stress is observed for FinFET diodes.

ESD protection for sub-45 nm MugFET technology

From the design point of view, while such technology options may result in increased transistor performance, the ability to achieve sufficient product reliability is to be addressed. Among the industry accepted reliability requirements, electrostatic discharge (ESD) reliability assessment is the focus of this work.